Ultra-low voltage and high current testing has become a rigid demand for AI GPU power supply, and specialized solutions address industry pain points

With the continuous explosion of demand for large model training and AI inference computing power, the iteration speed of GPU chips is accelerating. The core power supply characteristics of the new generation of AI GPUs have undergone significant changes: operating voltages are getting lower and lower, while instantaneous operating currents continue to rise. Ultra-low voltage and high current have become the core power supply characteristics of AI computing hardware, and corresponding power testing has also shifted from being an optional verification step in the past to an essential rigid demand for product implementation.

In traditional chip power supply scenarios, the voltage is high and the current is relatively small, with a mature power supply testing solution. However, AI GPUs completely overturn this characteristic. To reduce internal power consumption loss in the chip, the working voltage of the GPU core is continuously lowered. At the same time, a sudden full-load calculation can generate an ultra-high current surge of thousands of amperes. This poses multiple challenging problems for power supply testing: line voltage drop at low voltage can easily interfere with measurement accuracy, and the problems of heat generation and electromagnetic interference caused by high current are prominent. The current transient change speed is fast, and the response speed of ordinary power supply equipment cannot keep up with the load changes of the GPU, making it impossible to reproduce real working conditions. If the test data is distorted, hidden dangers will be planted in the tape-out and board design stages, leading to issues such as voltage drop under full load, overheat protection, unstable calculation power, and in severe cases, direct hardware damage.

Among various testing specifications, the **60V/2400A** solution perfectly aligns with the actual testing needs of today's high-end AI GPU boards. On one hand, the 60V voltage level can accommodate the front-end bus power supply scenario of the board, covering the input voltage range for parallel power supply to multiple GPUs. On the other hand, the ultra-large output current of 2400A can fully reproduce the current characteristics of GPU peak transient loading, enabling more than just simple verification of steady-state low current. This set of specifications can simultaneously complete multiple verifications such as steady-state power supply testing, dynamic transient load testing, long-term aging testing, and short-circuit protection, simulating the real working conditions of GPUs in training clusters and inference servers in a one-stop manner, thus compensating for the shortcomings of traditional low-current power supplies that cannot cover extreme operating conditions.

However, achieving 60V/2400A ultra-low voltage high-current testing is not as simple as simply increasing the power of the power supply. The industry generally faces several major pain points. The first is **measurement accuracy challenges**. With millivolt-level supply voltage, even small voltage drops caused by wires and terminals will be directly superimposed on the measured terminal, resulting in a discrepancy between the measured voltage and the actual voltage received by the GPU chip, leading to falsely labeled test results. The second is **thermal and structural challenges**. When 2400A high current flows through conductors, it generates significant Joule heat. If the internal conductors and wiring terminals of the equipment are not designed properly, prolonged testing will lead to continuous temperature rise, posing safety risks and causing parameter drift. The third is **insufficient transient response capability**. AI GPU computing power loads fluctuate at any time, and the current will rapidly rise and fall in microseconds. Ordinary high-power power supplies have insufficient loop bandwidth, and in the face of severe current jumps, the output voltage will oscillate violently, unable to restore the true load waveform. The fourth is **complex system integration**. High-power test systems are often bulky and cumbersome to wire, requiring multiple sets of equipment for synchronous control, data acquisition, and protection interlocking. This results in high construction costs and long debugging cycles.

Focusing on the challenges faced by these industries, a specialized ultra-low voltage high-current testing solution has been designed with targeted optimizations. To address the issue of line voltage drop, the solution employs remote sampling technology to directly collect voltage at the test points on GPU boards, eliminating errors caused by cable loss and ensuring the accuracy of low-voltage measurements. Conductors and connecting components are made of high-current-carrying, low-impedance materials, and the air duct structure is optimized to enhance heat dissipation capabilities, supporting long-duration high-current output and suppressing temperature drift. The power control loop is specifically tuned for GPU dynamic loads, improving transient response speed and accurately reproducing the current waveform during GPU high-speed loading and unloading. Additionally, it integrates functions such as current and voltage acquisition, fault protection, and data recording, simplifies system wiring, supports multi-channel synchronous linkage, and facilitates batch board testing for R&D engineers.

From an industrial perspective, the construction of AI computing power continues to expand, and server manufacturers, board design companies, and chip research and development institutions all require extensive verification of power supply reliability. In the past, many teams could only conduct simplified tests, which failed to cover extreme peak operating conditions. After the products were launched, power supply stability issues were exposed in high-load environments in data centers, leading to high maintenance and replacement costs. However, specialized testing solutions such as 60V/2400A bring the verification of extreme operating conditions to the research and development testing stage, enabling early detection of power supply design defects, reducing operational and maintenance risks in later server clusters, and shortening the time to market for AI hardware products.

Looking ahead, AI chip computing power will continue to improve, the current level supplied by GPUs will further break through, and the standards for ultra-low voltage and high current testing will also continue to be upgraded. Power testing equipment will no longer simply provide electrical energy output, but will become a key simulation and verification tool in the AI hardware research and development process. Specialized solutions that can provide high-precision, high-transient, and high-reliability ultra-high current testing will continue to empower the research and development iteration of AI GPUs and computing boards, laying a solid testing foundation for the stable development of the hardware base of the artificial intelligence industry.